Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters-Reference-Cited by-同舟云学术

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Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters

Published:2019-03 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE Applied Power Electronics Conference and Exposition (APEC)
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Author:

Polom Timothy A.,van der Broeck Christoph,De Doncker Rik W.,Lorenz Robert D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8716496/8721765/08721825.pdf?arnumber=8721825

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Practical Switch Condition Monitoring Solution for SiC Traction Inverters;IEEE Journal of Emerging and Selected Topics in Power Electronics;2023-04

2. Frequency-Domain Thermal Modeling of Power Modules Based on Heat Flow Spectrum Analysis;IEEE Transactions on Power Electronics;2023-02

3. Novel TIM Evaluation Method With in Situ Electrical Monitoring;IEEE Transactions on Components, Packaging and Manufacturing Technology;2023-02

4. Degradation Diagnosis of Power Modules based on Thermal Phase Response Sensing and Artificial Neural Networks;IEEE Transactions on Industry Applications;2023

5. Diagnosing Degradation in Power Modules Using Phase Delay Changes of Electrical Response;2022 IEEE 7th Southern Power Electronics Conference (SPEC);2022-12-05

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