Thermal Resistance Formulation and Analysis of III-V FETs Based on DC Electrical Data-Reference-Cited by-同舟云学术

Thermal Resistance Formulation and Analysis of III-V FETs Based on DC Electrical Data

Published:2021-12-05 Issue: Volume: Page:
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Container-title:2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
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Author:

Root David E.,Xu Jianjun,Iwamoto Masaya

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9682201/9682202/09682211.pdf?arnumber=9682211

Reference9 articles.

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4. Estimate of III-V FET thermal resistance from DC electrical measurements using artificial neural networks;iwamoto;Reliabiity of Compound Semiconductors Workshop 2021,0

5. Measurement and prediction of operating temperatures for GaAs ICs;smith;IEEE 1986 SEMITHERM Proceedings,0

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