Detection of Resistive Shorts and Opens using Voltage Contrast Inspection-Reference-Cited by-同舟云学术

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Detection of Resistive Shorts and Opens using Voltage Contrast Inspection

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Container-title:The 17th Annual SEMI/IEEE ASMC 2006 Conference
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Author:

Patterson O.D.,Wildman H.,Gal D.,Wu K.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/10915/34362/01638778.pdf?arnumber=1638778

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Testing and Fault-Localization Solutions for Monolithic 3D ICs;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18

2. Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductors;Ultramicroscopy;2019-09

3. Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits;Proceedings of the 2019 on Great Lakes Symposium on VLSI;2019-05-13

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