Enhanced Particle Filtering-Based Lifetime Prediction for IGBT in High-speed Trains
Author:
Affiliation:
1. East China Jiaotong University,School of Electrical and Automation Engineering,Nanchang,China,330013
Funder
National Natural Science Foundation of China
Research and Development
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10401266/10401328/10401553.pdf?arnumber=10401553
Reference21 articles.
1. Thermal modeling of diamomd-based power electronics package[C];Fabis
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4. Failure criteria for long term Accelerated Power Cycling Test linked to electrical turn off SOA on IGBT module. A 4000 hours test on 1200A–3300V module with AlSiC base plate
5. A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off
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