Author:
Orshansky M.,Chen J.C.,Chenming Hu
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
17 articles.
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1. Surrogate-Model-Based Analysis of Analog Circuits—Part I: Variability Analysis;IEEE Transactions on Device and Materials Reliability;2011-09
2. A table MOS transistor model parameter control;Russian Microelectronics;2010-09
3. Statistical Modeling With the PSP MOSFET Model;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2010-04
4. A Novel Approach to Link Process Parameters to BSIM Model Parameters;IEEE Transactions on Semiconductor Manufacturing;2009-11
5. Performance-Aware Corner Model for Design for Manufacturing;IEEE Transactions on Electron Devices;2009-04