Author:
Gruning T.,Mahlstedt U.,Koopmeiners H.
Cited by
33 articles.
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1. A Storage Based LBIST Scheme for Logic Diagnosis;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
3. Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults;2022 IEEE 31st Asian Test Symposium (ATS);2022-11
4. Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-08
5. An Efficient Procedure to Generate Highly Compact Diagnosis Patterns for Transition Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021