A Simple Model for Capture and Emission Time Constants of Random Telegraph Signal Noise-Reference-Cited by-同舟云学术

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A Simple Model for Capture and Emission Time Constants of Random Telegraph Signal Noise

Published:2011-11 Issue:6 Volume:10 Page:1352-1356
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Son Younghwan,Kang Taewook,Park Sunyoung,Shin Hyungcheol

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx5/7729/6069913/05752864.pdf?arnumber=5752864

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Local electric field perturbations due to trapping mechanisms at defects: What random telegraph noise reveals;Journal of Applied Physics;2023-03-16

2. A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

3. Phenomenon and Mechanism Investigation of the Cryogenic Random Telegraph Noise for 18 nm FDSOI CMOS;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25

4. Advanced Data Encryption using 2D Materials;Advanced Materials;2021-05-27

5. Random Telegraph Noise Under Switching Operation;Noise in Nanoscale Semiconductor Devices;2020

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