Author:
Eggersglub Stephan,Schmitz Kenneth,Krenz-Baath Rene,Drechsler Rolf
Cited by
2 articles.
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1. On Generation of Delay Test with Capture Power Safety;Communications in Computer and Information Science;2017
2. A Test Pattern Compaction Method Using SAT-Based Fault Grouping;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2016