Author:
Dalirsani Atefe,Hatami Nadereh,Imhof Michael E.,Eggenberger Marcus,Schley Gert,Radetzki Martin,Wunderlich Hans-Joachim
Cited by
3 articles.
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1. Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip;IEEE Transactions on Computers;2017-05-01
2. Functional Diagnosis for Graceful Degradation of NoC Switches;2016 IEEE 25th Asian Test Symposium (ATS);2016-11
3. Multi-Layer Test and Diagnosis for Dependable NoCs;Proceedings of the 9th International Symposium on Networks-on-Chip;2015-09-28