Author:
Zadegan Farrokh Ghani,Larsson Erik,Jutman Artur,Devadze Sergei,Krenz-Baath Rene
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Multi-Objective Evolutionary Approach for Test Network Design;2024 IEEE European Test Symposium (ETS);2024-05-20
2. RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. Optimal Pattern Retargeting in IEEE 1687 Networks: A SAT-based Upper-Bound Computation;ACM Transactions on Design Automation of Electronic Systems;2023-05-17
4. Refreshing the JTAG Family;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
5. Test Access Control for an Embedded MAC Unit Based Core using IEEE Std 1687;2021 International Conference on Power, Energy and Innovations (ICPEI);2021-10-20