Evaluation of Fabric Defect Detection Based on Transfer Learning with Pre-trained AlexNet
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IEEE
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http://xplorestaging.ieee.org/ielx7/8606660/8620719/08620888.pdf?arnumber=8620888
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Chip Analysis for Tool Wear Monitoring in Machining: A Deep Learning Approach;IEEE Access;2024
2. Fabric Defect Detection Method Using SA-Pix2pix Network and Transfer Learning;Applied Sciences;2023-12-20
3. Defect Detection Methods for Industrial Products Using Deep Learning Techniques: A Review;Algorithms;2023-02-08
4. Exploring and Exploiting Data-Free Model Stealing;Machine Learning and Knowledge Discovery in Databases: Research Track;2023
5. The Classification of Wafer Defects: An Evaluation of Different Feature-Based ResNet Transfer Learning Models with Support Vector Machine;Lecture Notes in Electrical Engineering;2023
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