Interface trap induced thermionic and field emission current in off-state MOSFET's-Reference-Cited by-同舟云学术

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Interface trap induced thermionic and field emission current in off-state MOSFET's

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Container-title:Proceedings of 1994 IEEE International Electron Devices Meeting
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Author:

Tahui Wang ,Tse-En Chang ,Chimoon Huang

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx2/3058/8678/00383440.pdf?arnumber=383440

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