Selective Staining on Non-Volatile Memory Cells for Data Retrieval

Author:

Zeng Xiao Mei1ORCID,Liu Qing1ORCID,Tay Jing Yun1,Gan Chee Lip2ORCID

Affiliation:

1. Temasek Laboratories@NTU, Nanyang Technological University, Singapore

2. Temasek Laboratories@NTU, and the School of Materials Science and Engineering, Nanyang Technological University, Singapore

Funder

National Research Foundation, Singapore, through the National Cybersecurity Research and Development Program/Cyber-Hardware Forensic and Assurance Evaluation Research and Development Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Networks and Communications,Safety, Risk, Reliability and Quality

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Security Assessment of Protected Execute-Only Firmware in Microcontrollers Through Selective Chemical Engraving;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06

2. A Comprehensive Data Retrieval and Correction Approach From 40-nm Flash Memory With Selective Chemical Engraving;IEEE Transactions on Information Forensics and Security;2024

3. Methodology of backside preparation applied on a MRAM to lead a logical investigation with a near-field probe;Microelectronics Reliability;2023-11

4. Security Evaluation of Microcontrollers: A Case Study in Smart Watches;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24

5. Hardware Moving Target Defenses against Physical Attacks;Proceedings of the 9th ACM Workshop on Moving Target Defense;2022-11-07

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