Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS
Author:
Affiliation:
1. School of ECE, Georgia Institute of Technology,Atlanta,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529313.pdf?arnumber=10529313
Reference6 articles.
1. AFE-CIM: A Current-Domain Compute-In-Memory Macro for Analog-to-Feature Extraction
2. A 32.2 TOPS/W SRAM Compute-in-Memory Macro Employing a Linear 8-bit C-2C Ladder for Charge Domain Computation in 22nm for Edge Inference
3. BeamCIM: A Compute-In-Memory based Broadband Beamforming Accelerator using Linear Embedding
4. Analysis of Effects of Aging on the Accuracy of Analog Computing-In-Memory Computation
5. BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity
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