Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks
Author:
Affiliation:
1. KU Leuven,ESAT,Leuven,Belgium
2. imec,Leuven,Belgium
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764555.pdf?arnumber=9764555
Reference14 articles.
1. Analytical Percolation Model for Predicting Anomalous Charge Loss in Flash Memories
2. New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
3. Methodologies for sub-1nm EOT TDDB evaluation
4. Accurate reliability evaluation of non-uniform ultrathin oxynitride and high-k layers
5. Accurate model for time-dependent dielectric breakdown of high-k metal gate stacks
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
2. Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
3. Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
4. Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications : Invited paper;2022 IEEE Latin American Electron Devices Conference (LAEDC);2022-07-04
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3