Author:
Chandra Anshuman,Kapur Rohit
Cited by
26 articles.
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1. Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs;2022 IEEE International Test Conference (ITC);2022-09
2. Minimum Power Test Pattern Generator for Testing VLSI Circuits;2022 6th International Conference on Devices, Circuits and Systems (ICDCS);2022-04-21
3. Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks;Sensors;2021-09-12
4. Low Cost Hypercompression of Test Data;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
5. Switching Activity of Faulty Circuits in Presence of Multiple Transition Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-04