Gate Driver Supply Architectures for Common Mode Conducted EMI Reduction in Series Connection of Multiple Power Devices
Author:
Funder
BPI France
OSEO (Project MEGaN)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/8468129/08281116.pdf?arnumber=8281116
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Analysis and Suppression on High dv/dt Caused Crosstalk in Driving Paths of SiC Full-bridge Inverters;2023 IEEE Energy Conversion Congress and Exposition (ECCE);2023-10-29
2. Noise Propagation Study within Gate Drivers for Medium-Voltage High Power SiC-Based Converters, Caused by Near Field Coupling;2023 IEEE Energy Conversion Congress and Exposition (ECCE);2023-10-29
3. Measurement, Analyses and Discussion on Noise Induced on Gate Driver Logic Signal Traces in Medium Voltage SiC-based Power Converters;2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI);2023-07-29
4. Zero common-mode voltage modulation in novel flying-capacitive VIENNA rectifier;2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia);2023-05-22
5. Compact MV-Insulated MHz Transformer-Coupled Gate Driver With Staged Turn-Off Scheme for Series-Connected Power Devices in DC Circuit Breaker Applications;IEEE Journal of Emerging and Selected Topics in Power Electronics;2023-04
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