Condition Monitoring of DC-Link Capacitors Using Goertzel Algorithm for Failure Precursor Parameter and Temperature Estimation-Reference-Cited by-同舟云学术

Condition Monitoring of DC-Link Capacitors Using Goertzel Algorithm for Failure Precursor Parameter and Temperature Estimation

Published:2020-06 Issue:6 Volume:35 Page:6386-6396
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Sundararajan Prasanth^ORCID,Sathik Mohamed Halick Mohamed^ORCID,Sasongko Firman^ORCID,Tan Chuan Seng^ORCID,Pou Josep^ORCID,Blaabjerg Frede^ORCID,Gupta Amit Kumar^ORCID

Funder

Rolls-Royce@NTU Corporate Lab

Nanyang Technological University

National Research Foundation Singapore

Corp Laboratory@University Scheme

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/63/9014414/08892651.pdf?arnumber=8892651

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