1. Design of Low Power and Energy Efficient Write Driver with Bitline Leakage Compensation for SRAM;Communications in Computer and Information Science;2024
2. PVT-variation based Comparative Analysis of Write Driver Designs for SRAM at 32 nm;2023 Second International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT);2023-04-05
3. Reduced March iC- Test for Detecting Ageing Induced Faults in Memory Address Decoders;2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID);2021-02