BIST-based test and diagnosis of FPGA logic blocks

Author:

Abramovici M.,Stroud C.E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Cited by 51 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. An Exploration of ATPG Methods for Redacted IP and Reconfigurable Hardware;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

3. Hybrid non scan with built-in self-test for fault coverage improvement;5TH INTERNATIONAL CONFERENCE ON ELECTRICAL, ELECTRONIC, COMMUNICATION AND CONTROL ENGINEERING (ICEECC 2021);2023

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