Author:
Hamdioui S.,Al-Ars Z.,Mhamdi L.,Gaydadjiev G.,Vassiliadis S.
Cited by
4 articles.
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1. Testing of Synchronizers in Asynchronous FIFO;Journal of Electronic Testing;2013-02
2. Testing Embedded Memories: A Survey;Mathematical and Engineering Methods in Computer Science;2013
3. A New Test Paradigm for Semiconductor Memories in the Nano-Era;2011 Asian Test Symposium;2011-11
4. Analysis of Resistive Open Defects in a Synchronizer;2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems;2009-10