Advances in Dry Etch Processing for High-Density Vertical Interconnects in Fan-Out Panel-Level Packaging and IC Substrates

Author:

Schein Friedrich-Leonhard1,Elghazzali Mohammed2,Voigt Christian1,Tsigaras Ioannis2,Sawamoto Hirofumi2,Strolz Ewald2,Rettenmeier Roland2,Bottcher Lars3

Affiliation:

1. TU Berlin,Faculty IV - Electrical Engineering and Computer Science,Berlin,Germany

2. Business Unit Advanced Packaging, Evatec AG,Trübbach,Switzerland

3. System Integration & Interconnection Technologies, Fraunhofer IZM,Berlin,Germany

Funder

TU Berlin

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Dry processes to form fine features on advanced substrates;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

2. State-Of-The-Art of Advanced Packaging;Chiplet Design and Heterogeneous Integration Packaging;2023

3. Multiple System and Heterogeneous Integration with TSV-Less Interposers;Chiplet Design and Heterogeneous Integration Packaging;2023

4. Fabrication of Ultra-Fine Micro-Vias in Non-Photosensitive Polyimide for High-Density Vertical Interconnects;Micromachines;2022-11-26

5. Dry etch processing in fan-out panel-level packaging - An application for high-density vertical interconnects and beyond;2022 IEEE 72nd Electronic Components and Technology Conference (ECTC);2022-05

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