Performance Projection of GaN HEMT: Bias and Temperature Dependent Study of 3rd-Order Intermodulation Distortion

Author:

Alim Mohammad A.1,Jahan I.2,Ali Mayahsa M.3,Gaquiere Christophe4

Affiliation:

1. University of Chittagong,Dept of Electrical and Electronic Engineering,Bangladesh

2. University of Information Technology and Communications,Baghdad,Iraq

3. Green University,Dept of Electrical and Electronic Engineering,Bangladesh

4. Institute of Electronic, Microelectronic Nanotechnology (IEMN), The University of Lille,France

Publisher

IEEE

Reference11 articles.

1. Compact modelling of nonlinear distortion in analogue communication circuits;wambacq;Design Automation and Test in Europe,0

2. Factors influencing intermodulation distortion performance of a FET

3. On the correlation between intermodulation distortion and RF transconductance for microwave GaN HEMT

4. Intrinsic dependence of intermodulation distortion in HEMTs;qu;Proceedings of the Asia Pacific Microwave Conference,0

5. Third-order intercepts and nonlinear distortion level investigation for pre and post multilayer pHEMTs

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