Author:
Chavali Krishna Mohan,Natarajan Mahadeva Iyer
Cited by
3 articles.
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1. Measuring and Modeling Single Event Transients in 12-nm Inverters;IEEE Transactions on Nuclear Science;2022-03
2. Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA;2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2020-10
3. A two-dimensional electrostatic potential model for total dose ionization effects in FOI FinFETs;2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2020-10