Author:
Allen Gregory R.,Scheick Leif Z.,Irom Farokh,Guertin Steven M.,Adell Philippe C.,Amrbar Mehran,Vartanian Sergeh,O'Connor Michael
Cited by
2 articles.
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1. Single Event Effects Results for COTS Microcontrollers and Microprocessors;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07
2. Single-Event Effects Measurements on COTS Electronic Devices for Use on NASA Mars Missions;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07