Author:
Seth S.C.,Agrawal V.D.,Farhat H.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
28 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
3. Error Model (EM)―A New Way of Doing Fault Simulation;2022 IEEE International Test Conference (ITC);2022-09
4. Multi-Heuristic Machine Intelligence Guidance in Automatic Test Pattern Generation;2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS);2022-05-23
5. Temporal Coverage Analysis for Dynamic Verification;IEEE Transactions on Circuits and Systems II: Express Briefs;2018-01