Author:
Panhofer Thomas,Friesenbichler Werner,Delvai Martin
Cited by
4 articles.
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1. Choice of granularity for reliable circuit design using dynamic reconfiguration;Microelectronics Reliability;2016-08
2. On the Feasibility of Built-In Self Repair for Logic Circuits;2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems;2011-10
3. Built-in Self Repair for Logic Structures;Design and Test Technology for Dependable Systems-on-Chip
4. Built-In Self Repair for Logic Structures;Nanotechnology