Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
47 articles.
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1. The History of Noise in Metal‐Oxide‐Semiconductor Field‐Effect Transistors;75th Anniversary of the Transistor;2023-07-03
2. Noise and RF Modeling;BSIM-Bulk MOSFET Model for IC Design - Digital, Analog, RF and High-voltage;2023
3. Analytical Modeling of Flicker Noise in Halo Implanted MOSFETs;IEEE Journal of the Electron Devices Society;2015-07
4. Gate-to-Drain Capacitance Dependent Model for Noise Performance Evaluation of InAlAs/InGaAs Double-gate HEMT;JSTS:Journal of Semiconductor Technology and Science;2013-08-31
5. Nanoscale FETs;Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications;2012