Neutron induced single-word multiple-bit upset in SRAM-Reference-Cited by-同舟云学术

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Neutron induced single-word multiple-bit upset in SRAM

Published:1999-12 Issue:6 Volume:46 Page:1427-1433
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Johansson K.,Ohlsson M.,Olsson N.,Blomgren J.,Renberg P.-U.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/17748/00819103.pdf?arnumber=819103

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4. Processor Design for Soft Errors;ACM Computing Surveys;2017-09-30

5. An EG-LDPC Based 2-Dimensional Error Correcting Code for Mitigating MBUs of SRAM Memories;Proceedings of the 12th FPGAworld Conference 2015;2015-09-08

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