Author:
Sasaki Yuto,Ichikawa Tamotsu,Kuwana Anna,Hatayama Kazumi,Kobayashi Haruo,Machida Kosuke,Aoki Riho,Katayama Shogo,Nakatani Takayuki,Wang Jianlong,Sato Keno,Ishida Takashi,Okamoto Toshiyuki
Cited by
3 articles.
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1. Innovative Practices Track: Innovative Analog Circuit Testing Technologies;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25
2. Modeling Technologies from Analog/Mixed-Signal Circuit Designer Viewpoint;2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2022-03-06
3. Testing Technologies for Analog/Mixed-Signal Circuits in IoT Era;IEEJ Transactions on Electronics, Information and Systems;2021-01-01