Making complex mixed-signal telecommunication integrated circuits testable-Reference-Cited by-同舟云学术

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Making complex mixed-signal telecommunication integrated circuits testable

Published:1999-06 Issue:6 Volume:37 Page:90-96
ISSN:0163-6804
Container-title:IEEE Communications Magazine
language:
Short-container-title:IEEE Commun. Mag.

Author:

Roberts G.W.,Dufort B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx5/35/16672/00769280.pdf?arnumber=769280

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhancement of radio frequency device's contact test using a novel method;IET Science, Measurement & Technology;2014-07

2. Process Variation Challenges and Solutions Approaches;Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip;2012

3. Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations;Journal of Electronic Testing;2011-02-09

4. A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing;Journal of Electronic Testing;2006-11-30

5. Strategic Test Cost Reduction with On-Chip Measurement Circuitry for RF Transceiver Front-Ends - An Overview;2006 49th IEEE International Midwest Symposium on Circuits and Systems;2006-08

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