Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
73 articles.
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1. A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems;Journal of Manufacturing Systems;2024-10
2. A Probabilistic Model for Estimating Defect-Limited Yield of ASICs;2024 Annual Reliability and Maintainability Symposium (RAMS);2024-01-22
3. Defect Tolerance in VLSI Circuits;Fault-Tolerant Systems;2021
4. Flexible and Stretchable Sensor Arrays;Case Studies in Micromechatronics;2020
5. Casual modeling of yield;Metrology, Inspection, and Process Control for Microlithography XXXIII;2019-03-26