Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits
Author:
Affiliation:
1. IXL, Bordeaux I Univ., Talence, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/22286/01039685.pdf?arnumber=1039685
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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2. Impact of TID on response to pulsed X-ray irradiation in the bipolar operational amplifier;Science China Technological Sciences;2015-01-15
3. Study of latch-up immunization in bulk CMOS integrated circuits exposed to transient ionizing radiation;Science China Technological Sciences;2012-05-25
4. RADIATION-TOLERANT DESIGN FOR HIGH PERFORMANCE MIXED-SIGNAL CIRCUITS;International Journal of High Speed Electronics and Systems;2004-06
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