A Robust-Compact Model to Imitate the Neuronal Dynamics with 2T based FeFET-MOSFET Capturing Temperature Effects
Author:
Affiliation:
1. IIITDM Kancheepuram,Department of ECE,Chennai,India,600127
Funder
Science and Engineering Research Board (SERB)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10117590/10117577/10118310.pdf?arnumber=10118310
Reference19 articles.
1. Investigating the performance degradation aspects in presence of induced interface trapped charges and sustaining it through back-gate bias;shaik;Semiconductor Science and Technology,2022
2. 28 nm FDSOI analog and RF Figures of Merit at N2 cryogenic temperatures
3. A Swarm Optimization Solver Based on Ferroelectric Spiking Neural Networks
4. Impact of unpreventable induced interface trapped charges on HZO based FDSOI NCFET
5. Neuro-Mimetic Dynamics of a Ferroelectric FET-Based Spiking Neuron
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