Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar Devices-Reference-Cited by-同舟云学术

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Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar Devices

Published:2019-01 Issue:1 Volume:66 Page:199-206
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Li Xiaolong^ORCID,Lu Wu,Guo Qi,Fleetwood Daniel M.^ORCID,He Chengfa,Wang Xin,Yu Xin,Sun Jing,Liu Mohan,Yao Shuai^ORCID

Funder

National Natural Science Foundation of China

Chinese Academy of Sciences

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/8620398/08520885.pdf?arnumber=8520885

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Influence of Deep-Level Defects With Various Depths in SiO₂ on Ionizing Damage;IEEE Transactions on Nuclear Science;2023-03

2. Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices;IEEE Transactions on Nuclear Science;2023

3. Simulation test technique for nuclear and space radiation effects;SCIENTIA SINICA Physica, Mechanica & Astronomica;2023-01-01

4. Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects;IEEE Access;2023

5. Characterization of Radiation Tolerance of Bipolar Transistor with Al₂O₃ Dielectric at Different Dose Rates;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03

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