Impact of Channel Hot Electrons on Current Collapse in AlGaN/GaN HEMTs-Reference-Cited by-同舟云学术

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Impact of Channel Hot Electrons on Current Collapse in AlGaN/GaN HEMTs

Published:2013-12 Issue:12 Volume:34 Page:1494-1496
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Hwang Injun,Kim Jongseob,Chong Soogine,Choi Hyun-Sik,Hwang Sun-Kyu,Oh Jaejoon,Shin Jai Kwang,Chung U-In

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/6669068/06650086.pdf?arnumber=6650086

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