First Demonstration of Junctionless Accumulation-Mode Bulk FinFETs With Robust Junction Isolation-Reference-Cited by-同舟云学术

First Demonstration of Junctionless Accumulation-Mode Bulk FinFETs With Robust Junction Isolation

Published:2013-12 Issue:12 Volume:34 Page:1479-1481
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Kim Tae Kyun,Kim Dong Hyun,Yoon Young Gwang,Moon Jung Min,Hwang Byeong Woon,Moon Dong-Il,Lee Gi Seong,Lee Dong Wook,Yoo Dong Eun,Hwang Hae Chul,Kim Jin Soo,Choi Yang-Kyu,Cho Byung Jin,Lee Seok-Hee

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/6669068/06623098.pdf?arnumber=6623098

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