Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor-Reference-Cited by-同舟云学术

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Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor

Published:2015-12 Issue:6 Volume:62 Page:2679-2686
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Roche N. J.-H.,Khachatrian A.,Buchner S.,Foster Charles C.,Ferlet-Cavrois V.,Muschitiello M.,Miller F.,Morand S.,Warner J.,Decker T.,McMorrow D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/7348735/07335662.pdf?arnumber=7335662

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automation of Laser Single-Event Effect Testing of Integrated Circuits for Space Missions;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13

2. Single Event Latch-up Effect of 130 nm Bulk Silicon CMOS Device Irradiated by Pulsed Laser;Chinese Journal of Space Science;2021

3. Nonstable Latchups in CMOS ICs Under Pulsed Laser Irradiation;IEEE Transactions on Nuclear Science;2020-07

4. Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation;IEEE Transactions on Nuclear Science;2019-07

5. Impact of TID on latch up induced by pulsed irradiation in CMOS circuits;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-02

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