Author:
Wang Jih-Jong,Rezzak Nadia,Dsilva Durwyn,Jia James,Cai Alex,Hawley Frank,McCollum John,Hamdy Esmat
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
11 articles.
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1. Programming mechanism and characteristics of Sense-Switch pFlash cells;Microelectronics Reliability;2023-04
2. TID and SEE characterization of Microchip PolarFire® SoC FPGA;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
3. Structure Design and Characteristics of Sense-Switch pFlash Devices;2021 IEEE 3rd International Conference on Circuits and Systems (ICCS);2021-10-29
4. Reliability evaluation on sense-switch p-channel flash;Journal of Semiconductors;2021-08-01
5. Copper Trace Fatigue Life Modeling for Rigid Electronic Assemblies;IEEE Transactions on Device and Materials Reliability;2021-03