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Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs

  • Published:2015-08 Issue:4 Volume:62 Page:1642-1649
  • ISSN:0018-9499
  • Container-title:IEEE Transactions on Nuclear Science
  • language:
  • Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Noh Jinhyun,Correas Vincent,Lee Soonyoung,Jeon Jongsung,Nofal Issam,Cerba Jacques,Belhaddad Hafnaoui,Alexandrescu Dan,Lee YoungKeun,Kwon Steve

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparative analysis of soft-error sensitivity in LU decomposition algorithms on diverse GPUs;The Journal of Supercomputing;2024-02-22

2. Multiscale, Multiphysics Modeling and Simulation of Single-Event Effects in Digital Electronics: From Particles to Systems;IEEE Transactions on Nuclear Science;2024-01

3. Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-07

4. A Comparison of 25GHz-LC-VCO Circuit Topologies for SEU Mitigation in 22nm FinFET;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11

5. Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
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