Author:
Zhengqiang Ma ,Jae-Sung Rieh ,Bhattacharya P.,Alterovitz S.A.,Ponchak G.E.,Croke E.T.
Cited by
1 articles.
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1. A Survey of Heterojunction Bipolar Transistor (HBT) Device Reliability;IEEE Transactions on Components and Packaging Technologies;2004-03