Characterization and modeling of DCR and DCR drift variability in SPADs
Author:
Affiliation:
1. TR&D, STMicroelectronics,Crolles,France
2. INL, UMR, CNRS 5270, Université de Lyon,Villeurbanne,France
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10117589/10117581/10117921.pdf?arnumber=10117921
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