RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications-Reference-Cited by-同舟云学术

RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications

Published:2023-03 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Reliability Physics Symposium (IRPS)
language:
Short-container-title:

Author:

Srinivasan P.¹,Lestage J.¹,Syed S.¹,Hui X.¹,Moss S.¹,Restrepo O. D.¹,Gonzalez O. H.¹,Chen Y.¹,McKay T.¹,Bandyopadhyay A.¹,Cahoon N.¹,Guarin F.¹,Min B.¹,Gall M.¹,Ludvik S.²

Affiliation:

1. GLOBALFOUNDRIES,Malta,NY,USA,12020

2. Power Technology Solutions,Palo Alto,CA,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10117589/10117581/10118043.pdf?arnumber=10118043

Reference7 articles.

1. RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications

2. A 26 dBm 39 GHz Power Amplifier with 26.6% PAE for 5G Applications in 28nm bulk CMOS

3. A Very Robust and Reliable 2.7GHz +31dBm Si RFSOI Transistor for Power Amplifier Solutions

4. CMOS RF reliability for 5G mm Wave applications-Challenges and Opportunities;srinivasan;Proc IEEE Int Rel Phy Symp,2021

5. A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mm Wave applications;srinivasan;Proc IEEE Int Rel Phy Symp,2021

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of Parallel RF Power Amplifier Using GaN HEMT with Independent Biasing Circuits for Wireless Communication;2024 IEEE International Black Sea Conference on Communications and Networking (BlackSeaCom);2024-06-24

2. A 22FDX® Wi-Fi PA Demonstrating a New LDMOS Device with 10V Breakdown Achieving Output Power of 29.5dBm at 40% PAE;2024 IEEE Radio Frequency Integrated Circuits Symposium (RFIC);2024-06-16

3. Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

4. Experimental Analysis of Power Amplifier Performance at Microwave Frequency;2024 IEEE 9th International Conference for Convergence in Technology (I2CT);2024-04-05