Author:
Velazco R.,Ecoffet R.,Faure F.
Cited by
7 articles.
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1. Research on heavy ion irradiation effects on SOI SRAM;Journal of Instrumentation;2023-10-01
2. Characterization of a RISC-V System-on-Chip under Neutron Radiation;2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS);2021-06-28
3. Detecting Single Event Upsets in Embedded Software;2018 IEEE 21st International Symposium on Real-Time Distributed Computing (ISORC);2018-05
4. Fault-Tolerance Techniques for FPGA;Fault-Tolerance Techniques for Spacecraft Control Computers;2017-01-27
5. On the Structural Robustness Assessment of Wireless Communication Systems for Intra-Satellite Applications;IEEE Transactions on Nuclear Science;2014-12