Characterization of a RISC-V System-on-Chip under Neutron Radiation
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9505031/9505022/09505054.pdf?arnumber=9505054
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Combining Fault Simulation and Beam Data for CNN Error Rate Estimation on RISC-V Commercial Platforms;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Using Software Mitigation Schemes to improve the availability of IoT applications in harsh radiation environment;Journal of Instrumentation;2024-02-01
3. Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
4. Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip;Electronics;2023-06-06
5. Radiation test flux selection methodology to optimize SEE observability on systems with different operating modes;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
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