Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
5 articles.
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1. Reliability;VLSI Electronics Microstructure Science;1989
2. Hot electrons in one dimension;Journal of Applied Physics;1985-09-15
3. Some aspects of hot-electron aging in MOSFET's;IEEE Transactions on Electron Devices;1984-10
4. Effect of hot-electron stress on low frequency MOSFET noise;IEEE Electron Device Letters;1984-09
5. Reliability problems with VLSI;Microelectronics Reliability;1984-01