Reliability problems with VLSI

Author:

Fantini Fausto

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference219 articles.

1. Invention of the integrated circuit

2. Large Scale Integrated Circuits Technology: State of the Art and Prospects,1982

3. Prospettive della Superintegrazione;Riccò,1979

4. Solid State: VLSI: Some fundamental challenges: Defining and designing the products made possible by very-large-scale integration are first on the list of priority tasks

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1. Research on Acceleration Test Model and Parameter Determination Method of Integrated Circuit;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08

2. REFERENCES;Reliable Computer Systems;1992

3. A model for moisture induced corrosion failures in microelectronic packages;IEEE Transactions on Components, Hybrids, and Manufacturing Technology;1990-06

4. VLSI reliability: Contributions from a three year national research program;European Transactions on Telecommunications;1990-03

5. Introduction to VLSI Testing;Rapid Reliability Assessment of VLSICs;1990

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