Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor-Reference-Cited by-同舟云学术

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Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor

Published:1992-06 Issue:3 Volume:39 Page:436-440
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Velazco R.,Karoui S.,Chapuis T.,Benezech D.,Rosier L.H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/6854/00277533.pdf?arnumber=277533

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fault Injection Methodologies;Radiation Effects on Integrated Circuits and Systems for Space Applications;2019

2. System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs);Radiation Effects on Integrated Circuits and Systems for Space Applications;2019

3. System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults;2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2018-09

4. System-Level Analysis of the Vulnerability of Processors Exposed to Single-Event Upsets via Probabilistic Model Checking;IEEE Transactions on Nuclear Science;2017-09

5. Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures;IEEE Transactions on Dependable and Secure Computing;2011-03

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