Fault Injection Methodologies-Reference-Cited by-同舟云学术

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Fault Injection Methodologies

Published:2019 Issue: Volume: Page:127-144
ISSN:
Container-title:Radiation Effects on Integrated Circuits and Systems for Space Applications
language:
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Author:

Entrena Luis,García-Valderas Mario,Lindoso Almudena,Portela-Garcia Marta,San Millán Enrique

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-030-04660-6_6

Reference31 articles.

1. R.C. Baumann, Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans. Device Mater. Reliab. 5(3), 305–316 (2005)

2. H. Ziade et al., A survey on fault injection techniques. Int. Arab J. Inf. Technol. 1(2), 171–186 (2004)

3. M.C. Hsueh, T.K. Tsai, R.K. Iyer, Fault injection techniques and tools. Computer 30(4), 75–82 (1997)

4. H.M. Quinn, D.A. Black, W.H. Robinson, S.P. Buchner, Fault simulation and emulation tools to augment radiation-hardness assurance testing. IEEE Trans. Nucl. Sci. 60(3), 2119–2142 (2013)

5. R. Velazco, S. Karoui, T. Chapuis, D. Benezech, L.H. Rosier, Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor. IEEE Trans. Nucl. Sci. 39(3), 436–440 (1992)

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1. Vertical-horizontal model of states of software with injected defects;2022 12th International Conference on Dependable Systems, Services and Technologies (DESSERT);2022-12-09

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