1. Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
2. Models for Bridging Defects;Models in Hardware Testing;2009-10-27
3. Power-Aware System-Level Test Planning;Power-Aware Testing and Test Strategies for Low Power Devices;2009-08-13
4. A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits;2009 14th IEEE European Test Symposium;2009-05
5. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies;Frontiers In Electronic Testing;2008